Paul Kish is a Forensic Consultant in Bradford, NY. He holds a B.S. in Criminal Justice and a M.S. in Education from Elmira College.
He has over 30 years of experience as a consulting bloodstain pattern and crime scene reconstruction expert. He has been consulted on over 1000 homicide cases in 47 states and 13 countries while presenting expert testimony in 31 states, the District of Columbia, Israel, and Canada. Mr. Kish has testified in state and federal court as well as in military court martial proceedings.
Mr. Kish is an internationally known lecturer on the subject of bloodstain pattern analysis lecturing throughout the United States, as well as in Canada, England, the Netherlands, and Sweden. He has educated over 1000 students from 18 countries during week-long courses on bloodstain pattern analysis.
Mr. Kish has served on the Board of Directors for the American Academy of Forensic Sciences. He is the Vice-Chair of the Bloodstain Pattern Analysis Consensus Body of the American Academy of Forensic Sciences Standards Board. In 2014, he was appointed by NIST to the Organization of Scientifc Area Committees (OSAC), Scientific Area Committee (SAC) on Physics and Pattern Evidence where he sewrved until 2020.
Mr. Kish is an author of various articles and textbook chapters on the topic of bloodstain patterns and served on the executive board of SWGSTAIN (Scientific Working Group on Bloodstain Pattern Analysis) for 12 years. He is a past Editor of the International Association of Bloodstain Analysis NEWS and a past Chair of the American Academy of Forensic Sciences’ General Section.
He is currently a Fellow in the American Academy of Forensic Sciences and has membership in the Canadian Society of Forensic Sciences, International Association of Bloodstain Analysts, and the International Association for Identification. In 1997, he was the first recipient of the American Academy of Forensic Sciences, General Section, Achievement Award. In 2005, he was awarded the American Academy of Forensic Sciences, General Section, Paul W. Kehres Meritorious Service Award. In 2013, he was awarded the honor of Distinguished Member by the International Association of Bloodstain Pattern Analysts in recognition of his service to IABPA and accomplishments in the field of bloodstain pattern analysis. In 2015, he was awarded the American Academy of Forensic Sciences, General Section, Robert "Bob" Thibault Award. In 2020, he was awarded the American Academy of Forensics, General Section, John R, Hunt Award.
He has co-authored a book entitled Principles of Bloodstain Pattern Analysis – Theory and Practice which is available through CRC Press.
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